Runtime Power Focused Stress with Driver Verifier's Concurrency Stress
This test performs I/O on different combinations of devices to alternate the devices between Active and Idle condition. Creating different combinations of devices being Active and Idle will help to ensure that the PEP logic is fully exercised.
Test details
Specifications |
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Platforms |
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Supported Releases |
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Expected run time (in minutes) | 120 |
Category | Development |
Timeout (in minutes) | 120 |
Requires reboot | false |
Requires special configuration | false |
Type | automatic |
Additional documentation
Tests in this feature area might have additional documentation, including prerequisites, setup, and troubleshooting information, that can be found in the following topic(s):
Troubleshooting
For generic troubleshooting of HLK test failures, see Troubleshooting Windows HLK Test Failures.
For troubleshooting information, see Troubleshooting System Fundamentals Testing.
More information
Command syntax
Command option | Description |
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TE.exe /inproc /enablewttlogging /appendwttlogging rtpwrstresscuzz.dll /p:"TestCycles=[TestCycles]" /p:"DelayBetweenCycles=[DelayBetweenCycles]" /p:"IODuration=[IODuration]" /p:"VerifierFlags=[VerifierFlags]" /p:"TestTimeoutValue=[TestTimeoutValue]" /p:"OptTeCmdLineParams=[OptTeCmdLineParams]" |
Runs the test. |
Note
For command-line help for this test binary, type /h
File list
File | Location |
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Rtpwrstresscuzz.dll |
[OSBinRoot]\ |
Te.exe |
[TAEFBinRoot]\ |
Parameters
Parameter name | Parameter description |
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DQ | SDEL Device Query |
TestCycles | Number of test cycles |
DelayBetweenCycles | Delay time in milliseconds between each test cycle |
IODuration | I/O duration in milliseconds |
VerifierFlags | Driver Verifier flags to enable |
TestTimeoutValue | Timeout value for the execution of te.exe |
OptTeCmdlineParams | Optional commandline parameters for te.exe |