Modern Standby Stress with Driver Verifier's Concurrency Stress
This test causes the system to enter and exit Connected Standby by pressing a software power button. It also performs I/O on devices before entering Connected Standby.
Test details
Specifications |
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Platforms |
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Supported Releases |
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Expected run time (in minutes) | 300 |
Category | Development |
Timeout (in minutes) | 300 |
Requires reboot | false |
Requires special configuration | false |
Type | automatic |
Additional documentation
Tests in this feature area might have additional documentation, including prerequisites, setup, and troubleshooting information, that can be found in the following topic(s):
Running the test
Before you run the test, complete the test setup as described in the test requirements: WDTF System Fundamentals Testing Prerequisites.
Troubleshooting
For generic troubleshooting of HLK test failures, see Troubleshooting Windows HLK Test Failures.
For troubleshooting information, see Troubleshooting System Fundamentals Testing.
This test returns Pass or Fail. To review test details, review the test log from Windows Hardware Lab Kit (Windows HLK) Studio.
More information
Parameter | Description |
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DQ |
The SDEL device query. |
TestCycles |
The number of test cycles for this test. |
DelayBetweenCycles |
The delay time in milliseconds between each test cycle. |
IODuration |
The I/O duration in milliseconds. |
CSDuration |
The Connected Standby duration in milliseconds. |
VerifierFlags |
The Driver Verifier flags to enable. |
TestTimeoutValue |
The timeout value for the execution of te.exe. |
OptTeCmdlineParams |
The optional command line parameters for te.exe. |
Command syntax
Command option | Description |
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TE.exe /inproc /enablewttlogging /appendwttlogging csstresscuzz.dll /p:DQ=[DQ] /p:TestCycles=[TestCycles] /p:DelayBetweenCycles=[DelayBetweenCycles] /p:IODuration=[IODuration] /p:CSDuration=[CSDuration] /p:VerifierFlags=[VerifierFlags] |
Runs the Connected Standby Stress with Driver Verifier's Concurrency Stress (Logo) test job. |
Note
For command-line help for this test binary, type /h
.
Parameters
Parameter name | Parameter description |
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DQ | SDEL Device Query |
TestCycles | Number of test cycles |
DelayBetweenCycles | Delay time in milliseconds between each test cycle |
IODuration | I/O duration in milliseconds |
CSDuration | Connected Standby duration in milliseconds |
VerifierFlags | Driver Verifier flags to enable |
TestTimeoutValue | Timeout value for the execution of te.exe |
OptTeCmdlineParams | Optional commandline parameters for te.exe |
EnableDRIPSWatchdog | Enable DRIPS watchdog |
DRIPSWatchdogActionBitmask | DRIPS watchdog action bitmask |
DRIPSWatchdogTimeout | DRIPS watchdog timeout in seconds |