Command-Line Parameters for the Smart Card Reader Insertion and Removal Test (Windows Embedded CE 6.0)
1/6/2010
Applies to Windows Embedded CE 6.0 R2
Tests whether inserting or removing a smart card reader results in the appropriate smart card subsystem state.
Syntax
tux.exe [tuxparams] -d ifdtesttux.dll -x 2000 [-c "[-n iterations] [-p iterations] [-c]"]
Command-line parameters
| Command-line parameter | Description |
|---|---|
tux.exe tuxparams |
For information about the command-line parameters of the Tux test harness, see Tux Command-Line Parameters. |
-d ifdtesttux.dll |
Specifies the DLL to use for the Smart Card Reader Insertion and Removal test. |
-c " … " |
Specifies a list of test-specific parameters that Tux passes to the test DLL. |
-x TestCaseID |
Specifies the test case to run. |
-n iterations |
Specifies how many times to run the test. The default value of iterations is 1. To repeat indefinitely, set the value of iterations to 0. |
-p iterations |
Specifies the number of insertion and removal cycles that the test performs before executing AutoIFD. |
-c |
Specifies that the test never requests that the smart card be removed after AutoIFD completes. This parameter is useful for automating stress testing. |
Remarks
For more information about the Smart Card Reader (IFDTest2) tests, see the PC/SC Workgroup's Web site.