Command-Line Parameters for the Smart Card Reader Surprise Removal Test (Windows Embedded CE 6.0)
1/6/2010
Applies to Windows Embedded CE 6.0 R2
This test verifies that unexpected removal of the smart card reader results in the appropriate subsystem state.
Syntax
tux.exe [tuxparams] -d ifdtesttux -x 2001 [-c "[-n iterations] [-p iterations]"]
Command-line parameters
| Command-line parameter | Description |
|---|---|
tux.exe tuxparams |
For information about the command-line parameters of the Tux test harness, see Tux Command-Line Parameters. |
-d ifdtesttux.dll |
Specifies the DLL to use for the Smart Card Reader Surprise Removal test. |
-c " … " |
Specifies a list of test-specific parameters that Tux passes to the test DLL. |
-x TestCaseID |
Specifies the test case to run. |
-n iterations |
Specifies how many times to run the test. The default value of iterations is 1. To repeat indefinitely, set the value of iterations to 0. |
-p iterations |
Specifies the number of insertion and removal cycles that the test performs before executing AutoIFD. |