USB Full Speed OHCI (1.1) or UHCI (1.0) Interface Stress Test (Compact 2013)
3/26/2014
Please refer to the "USB High Speed EHCI (2.0) Interface Stress Test" for test documentation.
This test differs from "USB High Speed EHCI (2.0) Interface Stress Test" only in the way the function device is set up. Instead of executing "s lufldrv", use the following instead: "s lufldrv -f".
Test Prerequisites
Your device must meet the following requirements before you run this test.
Please refer to the "USB High Speed EHCI (2.0) Interface Stress Test" for test documentation.
Subtests
This test has no subtests.
Setting Up the Test
Please refer to the "USB High Speed EHCI (2.0) Interface Stress Test" for test documentation.
Running the Test
Please refer to the "USB High Speed EHCI (2.0) Interface Stress Test" for test documentation.
This test differs from "USB High Speed EHCI (2.0) Interface Stress Test" only in the way the function device is set up. Instead of executing "s lufldrv", use the following instead: "s lufldrv -f". This sets up the loopback device as a full-speed device.
Verifying the Test
Please refer to the "USB High Speed EHCI (2.0) Interface Stress Test" for test documentation.
Troubleshooting the Test
Please refer to the "USB High Speed EHCI (2.0) Interface Stress Test" for test documentation.