OAL - Cache Tests (Compact 2013)

3/26/2014

The OAL - Cache tests are comprised of the following.

In This Section

Test	Description
OAL Cache Churn Test	Causes churn of the memory hierarchy and cache systems by mixing operations such as allocation, freedom, and reading and writing on blocks of memory
OAL - No Cache Tests	Expose problems in the kernel, OEM adaptation layer (OAL) cache implementation, hardware cache implementation, and memory chips
Real-Time Data-Cache-Size Calculation Test	Calculate the size of the L1 data cache while the Windows Embedded Compact device is used
Write-back Cache Mode Tests	Expose problems in the kernel, OEM adaptation layer (OAL) cache implementation, hardware cache implementation, and memory chips
Write-through Cache Mode Tests	Expose problems in the kernel, OEM adaptation layer (OAL) cache implementation, hardware cache implementation, and memory chips