USB Stress Test (Windows Embedded CE 6.0)
1/6/2010
The USB stress test runs common scenarios for USB on the platform that is being tested, but at a higher rate of frequency and with larger payloads, in order to stress the system and reveal possible defects that escape more generic test suites. The stress test generates payloads by using the random seed parameter from Tux.exe, enabling a reproducible set of transfers. Additionally, the stress test emulates common functions. They enable the debugging of issues at the bus level before connecting to real devices.
In This Section
- Prerequisites for the USB Stress Test
Specifies the hardware and software requirements for this test.
- Troubleshooting the USB Stress Test
Describes the test cases for this test.
- Command-Line Parameters for the USB Stress Test
Describes the command-line parameters for this test.
- Running the USB Stress Test
Describes how to run this test.
- Troubleshooting the USB Stress Test
Provides troubleshooting tips for this test