IOCTL_HAL_WHQL_TEST_MODE (Compact 2013)
10/16/2014
This I/O control message determines if the hardware is in a jumpered test mode. This control has been deprecated in Windows Embedded Compact 2013. Send this message with OEMIoControl.
Syntax
BOOL OEMIoControl(
DWORD dwIoControlCode, // use IOCTL_HAL_WHQL_TEST_MODE
LPVOID lpInBuffer, // pointer to input buffer
DWORD nInBufferSize, // input buffer size
LPVOID lpOutBuffer, // pointer to output buffer
DWORD nOutBufferSize, // output buffer size
LPDWORD lpBytesReturned // number of bytes returned
);
Parameters
- dwIoControlCode
[in] Control code for the operation. Use IOCTL_HAL_WHQL_TEST_MODE for this operation.
- lpInBuffer
[in] Set to NULL.
- nInBufferSize
[in] Set to zero.
- lpOutBuffer
[out] Pointer to a DWORD value. A value of 1 indicates that the hardware is in jumper test mode; otherwise, the value is 0.
- nOutBufferSize
[out] Size of lpOutBuffer.
- lpBytesReturned
[in] If not NULL, set to size of DWORD.
Return Values
Returns TRUE if successful; otherwise, returns FALSE.
Requirements
Header |
pkfuncs.h |