Test Cases for the Storage Device Block Driver Performance Test (Windows Embedded CE 6.0)
1/6/2010
The following table shows the test cases for the Storage Device Block Driver Performance Test.
| Test case | Description |
|---|---|
1001 |
Measures the I/O throughput of write and read certain number of sectors (based on the input parameter) at a time to any; sector of the disk that can be read back correctly. This test case fails if data is corrupted while reading or writing, or if the boundary of a read or write buffer is overwritten. |
1002 |
Measures the I/O throughput of write and read to multiple scatter-gather (SG) buffers. First, this test case writes data by using a single SG buffer. Then, it reads data by using between 2 and 8 SG buffers of random size and compares the data written to the data read. This test case fails if the driver for the storage device does not support reading multiple SG buffers, if the driver requires individual SG buffers to be sector aligned, or if data is corrupted while reading or writing. |