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OAL Cache Tests (Windows Embedded CE 6.0)

  • Article

1/6/2010

The OAL Cache Tests assess the cache and memory subsystem of a Windows Embedded CE powered device. These tests can expose problems in the kernel, OEM adaptation layer (OAL) cache implementation, hardware cache implementation, and memory chips.

In This Section

  • OAL Cache Churn Test
    Applies to Windows Embedded CE 6.0 R2

    Performs various mixed operations in virtual memory to find problems with the implementation of the data cache

  • OAL Cache Test
    Tests the following cache functionality:

    • Print Cache Information
    • No Caching
    • Write-through
    • Test Write-back

  • Real-Time Data-Cache-Size Calculation Test
    Applies to Windows Embedded CE 6.0 R2

    Calculates the size of the L1 data cache while the Windows Embedded CE powered device is being used by continuously reading the data from the cache

See Also

Concepts

OAL Tests

Other Resources

CETK Tests