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Windows Embedded Test Catalog (Compact 2013)

3/26/2014

The Windows Embedded Test catalog is the master list of all test cases that are included in the Windows Embedded Compact Test Kit (CTK). Each test area, such as Display or Networking, contains a number of individual tests that you can select and run. The current Windows Embedded Test catalog includes the following tests:

  • Accelerometer
  • Audio
  • Backlight
  • Battery
  • Communication Bus
  • Display
  • File System
  • Input
  • Kernel
  • Multimedia
  • Networking
  • NLED (Notification light-emitting diode)
  • OAL (OEM Abstraction Layer)
  • Power Manager
  • Security
  • Shell
  • Storage Media
  • USB

See Also

Concepts

Manage Tests