Test Cases for the Flash Memory Read/Write and Performance Test (Windows Embedded CE 6.0)
1/6/2010
The following table shows the test cases for the Flash Memory Read/Write and Performance Test. These test cases fail if the driver does not support formatting, deleting, reading, or writing. They also fail if the data read is not the same as the data written.
Note
During the test, all information on the storage device is destroyed. The test writes to and reads from sectors on the storage device without preserving the contents of the sectors. Microsoft recommends that you back up data on all cards and disks that are attached to the tested device before running the test.
| Test case | Description |
|---|---|
1001 |
Repeat at sector zero Writes data repeatedly to sector zero and reads it back. The total count of write operations is equal to the number of sectors multiplied by the value specified in the |
1002 |
Repeat sector sequential Writes data to each sector in sequence, starting at sector zero. The total count of write operations is equal to the number of sectors multiplied by the value specified in the |
1003 |
Repeat sector random Writes data to randomly selected locations. The total count of write operations is equal to the number of sectors multiplied by the value specified in the |
1004 |
Repeat write on filled disk Writes to every sector of the disk until it is full, and then deletes and writes repeatedly to a single location. |
2000-2095 |
Fill FLASH linearly, and test read/write throughput Fills the disk to XX percent, where 20XX is the number of the test case, by writing data to each sector in sequence starting from sector zero. After the disk fills to the specified percentage, read/write performance is tested. |
3000-3095 |
Fill FLASH randomly and test read/write throughput Fills the disk to XX percent, where 30XX is the number of the test case, by writing data to random sector locations. After the disk fills to the specified percentage, read/write performance is tested. |
4000-4095 |
Fill FLASH fragmented and test read/write throughput Fills the disk to XX percent, where 40XX is the number of the test case, in a way that maximizes fragmentation of free space. After the disk fills to the specified percentage, read/write performance is tested. |
5000-5095 |
Fill FLASH completely, free linearly and test read/write throughput Fills the disk to 100% of capacity, and then frees XX percent of sectors consecutively starting at sector zero, where 50XX is the number of the test case. After space is freed to the specified percentage, read/write performance is tested. |
6000-6095 |
Fill FLASH completely, free randomly and test read/write throughput Fills the disk to 100% of capacity, and then frees XX percent of sectors randomly, where 60XX is the number of the test case. After space is freed to the specified percentage, read/write performance is tested. |
7000-7095 |
Fill FLASH completely, free fragmented and test read/write throughput Fills the disk to 100% of capacity, and then frees XX percent of sectors in a way that maximizes fragmentation of free space, where 70XX is the number of the test case. After space is freed to the specified percentage, read/write performance is tested. |