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Command Line Parameters for the Storage Device Block Driver Read/Write Test (Windows Embedded CE 6.0)

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1/6/2010

The Flash Memory Read/Write and Performance Test assesses the functionality of a mass storage block driver for a flash memory device. With this test, you can assess a driver that implements sector management in software, for example a driver for a NAND flash or NOR flash device.

The Storage Device Block Driver Read/Write Test executes the tux –o –d rwtest command line on default execution.

Syntax

tux –o –d rwtest -zorch [-disk DSKX:] [-profile <profile>] 
[-threads <count>] [-sectors <count>] [-writesector <sector>] 
[-writes <count>] [-store]

Parameters

  • -o
    Logs all Kato output to the debugger.
  • -d rwtest
    This parameter allows the Tux client to load one or more default test modules. When you pass in the rwtest option, the Tux client loads rwtest module and immediately begins to execute the specified tests for rwtest.

  • -disk DSKX**:**
    Specifies the device name of the disk to be tested.

    If you do not specify this parameter, the test probes for a mass storage disk on devices DSK1-DSK9. Specifying this parameter overrides the automatic detection process and forces the test to use the disk that you specify.

  • -profile <profile>
    Specifies the storage profile and limits testing to the devices with the specified storage profile.

    The default storage profile is "all profiles".

  • -threads <count>
    Specifies the number of threads that will simultaneous write data to the disk.
  • -sectors <count>
    Specifies the number of contiguous sectors to which each thread reads and writes data.

  • -writesector <sector>
    Specifies the fist sector on the disk that the test will begin reading and writing data. The first enumerated thread starts reading and writing at the specified sector. The second enumerated thread starts at the sector that is count number of sectors from the first sector, where count is determined from the /sector parameter.

    Each thread is designated a block of count number of contiguous sectors where the first sector is spaced count number of sectors from the first sector belonging to the previous enumerated thread.

  • -writes <count>
    Specifies the number of times that each thread writes to its designated block of sectors.

  • -store
    Specifies that the test opens a handle to the disk by calling the OpenStore function instead of the CreateFile function.

    Notice that you are not required to open a handle by using OpenStore in order to test block driver functionality. However, it is useful for testing a storage device that FileSys.exe loads automatically if you cannot open the storage device as a stream device. For example, you can open a handle to a flash driver for ROM by using the OpenStore function.

  • -zorch
    Enables the functionality of the test. Without this parameter, the test will fail. With this parameter, the test will run and destroy all data on the storage device.

Remarks

Prior to running this test, be aware that all information on the storage device is destroyed. The test writes to and reads from sectors on the storage device without preserving the contents of the sectors. It is strongly recommended that you back up data on all cards and disks that are attached to the tested device before running the test.

If you run the unmodified test, it will fail. In the results file you will see a message warning you to back up data on all cards and disks that are attached to the testing device before running the test. It then instructs you to modify the command line by right clicking on the test in the Windows Embedded CE 6.0 Test Kit (CETK) tree control, choosing Edit Command Line, and adding the following switch to the command line:

-zorch

After saving this change, you can run the test successfully. You can also pass this parameter in with Tux's -c command line parameter. There are no other command line parameters for this test.

See Also

Other Resources

Storage Device Block Driver Read/Write Test